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Preparation and testing of SNOM probes
Bobek, Juraj ; Pavera, Michal (referee) ; Spousta, Jiří (advisor)
The area of research that deals with surface modification and preparation of nanostructures is still very unexplored. And only a little contribution to this field is discussed in this bachelor thesis. Its goal is to manufacture and to test a probe made off hollow optical fibre that is used in Scanning Probe Microscopy. Optical fibre parameters in combination with proper and unique techniques allow the breakthrough off very interesting applications. It's worth mentioning the gas injection in the proximity of the surface of a sample (GIS) and thus its modification by use of electrons (FEBID), ions (FIBID) or laser beams.
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Focused eletron beam induced deposition
Juřík, Karel ; Zmeškal, Oldřich (referee) ; Pospíšil, Jan (advisor)
Within this work, a set of depositions induced by focused electron beam was prepared. The depositions were prepared in the presence of water vapours from trimethyl(methylcyclopentadienyl)platinum(IV) precursor. The dependence of prepared materials purity on beam accelerating voltage and water vapour pressure was measured. The best platinum content was achieved at (27,2 ± 0,4) at. %, with beam accelerating voltage 5 kV, beam current 1600 pA and water vapour pressure 100 Pa. Due to subsequent long-term exposure to light, air humidity and air oxygen, the platinum content was increased to (39,2 ± 2,1) at. %.
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Correlated probe and electron microscopy for the study of modern magnetic nanomaterials
Novotný, Ondřej ; Flajšman, Lukáš (referee) ; Pavera, Michal (advisor)
High pressure on the development of new magnetic materials and their miniaturization also emphasizes the development of new analytical techniques. This diploma thesis deals with the development and demonstration of correlated magnetic force and electron microscopy, which is a promising tool for the characterization of magnetic nanomaterials. The first part of this thesis describes the fundamental physics of micromagnetism with a focus on cylindrical nanofibers. The following pages describe optic, probe, electron, and synchrotron methods for mapping the magnetic properties of materials. The next part describes magnetic domain wall motion in cylindrical nanowires performed as a part of a more extensive material study. The last part of the thesis describes the development of correlated magnetic force and electron microscopy on LiteScope device. A production of magnetic probes was designed and successfully tested. Probes were fabricated by focused electron beam-induced deposition from the Co2(CO)8 precursor. Further, the developed correlated microscopy is demonstrated on a multilayer PtCo sample, magnetic cylindrical nanofibers, NiFe vortex structures, and FeRh metamagnetic nano-islands.
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Application onf the Focused Ion on Electron Beam in Nanotechnologies
Šamořil, Tomáš ; Mikulík, Petr (referee) ; Jiruše, Jaroslav (referee) ; Šikola, Tomáš (advisor)
Nowadays, the systems that allow simultaneous employment of both focused electron and ion beams are very important tools in the field of micro- and nanotechnology. In addition to imaging and analysis, they can be used for lithography, which is applied for preparation of structures with required shapes and dimensions at the micrometer and nanometer scale. The first part of the thesis deals with one lithographic method – focused electron or ion beam induced deposition, for which a suitable adjustment of exposition parameters is searched and quality of deposited metal structures in terms of shape and elemental composition studied. Subsequently, attention is paid also to other types of lithographic methods (electron or ion beam lithography), which are applied in preparation of etching masks for the subsequent selective wet etching of silicon single crystals. In addition to optimization of mentioned techniques, the application of etched silicon surfaces for, e.g., selective growth of metal structures has been studied. The last part of the thesis is focused on functional properties of selected 2D or 3D structures.
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Correlated probe and electron microscopy for the study of modern magnetic nanomaterials
Novotný, Ondřej ; Flajšman, Lukáš (referee) ; Pavera, Michal (advisor)
High pressure on the development of new magnetic materials and their miniaturization also emphasizes the development of new analytical techniques. This diploma thesis deals with the development and demonstration of correlated magnetic force and electron microscopy, which is a promising tool for the characterization of magnetic nanomaterials. The first part of this thesis describes the fundamental physics of micromagnetism with a focus on cylindrical nanofibers. The following pages describe optic, probe, electron, and synchrotron methods for mapping the magnetic properties of materials. The next part describes magnetic domain wall motion in cylindrical nanowires performed as a part of a more extensive material study. The last part of the thesis describes the development of correlated magnetic force and electron microscopy on LiteScope device. A production of magnetic probes was designed and successfully tested. Probes were fabricated by focused electron beam-induced deposition from the Co2(CO)8 precursor. Further, the developed correlated microscopy is demonstrated on a multilayer PtCo sample, magnetic cylindrical nanofibers, NiFe vortex structures, and FeRh metamagnetic nano-islands.
|
|
|
Focused eletron beam induced deposition
Juřík, Karel ; Zmeškal, Oldřich (referee) ; Pospíšil, Jan (advisor)
Within this work, a set of depositions induced by focused electron beam was prepared. The depositions were prepared in the presence of water vapours from trimethyl(methylcyclopentadienyl)platinum(IV) precursor. The dependence of prepared materials purity on beam accelerating voltage and water vapour pressure was measured. The best platinum content was achieved at (27,2 ± 0,4) at. %, with beam accelerating voltage 5 kV, beam current 1600 pA and water vapour pressure 100 Pa. Due to subsequent long-term exposure to light, air humidity and air oxygen, the platinum content was increased to (39,2 ± 2,1) at. %.
|
|
|
Preparation and testing of SNOM probes
Bobek, Juraj ; Pavera, Michal (referee) ; Spousta, Jiří (advisor)
The area of research that deals with surface modification and preparation of nanostructures is still very unexplored. And only a little contribution to this field is discussed in this bachelor thesis. Its goal is to manufacture and to test a probe made off hollow optical fibre that is used in Scanning Probe Microscopy. Optical fibre parameters in combination with proper and unique techniques allow the breakthrough off very interesting applications. It's worth mentioning the gas injection in the proximity of the surface of a sample (GIS) and thus its modification by use of electrons (FEBID), ions (FIBID) or laser beams.
|
|
|
Application onf the Focused Ion on Electron Beam in Nanotechnologies
Šamořil, Tomáš ; Mikulík, Petr (referee) ; Jiruše, Jaroslav (referee) ; Šikola, Tomáš (advisor)
Nowadays, the systems that allow simultaneous employment of both focused electron and ion beams are very important tools in the field of micro- and nanotechnology. In addition to imaging and analysis, they can be used for lithography, which is applied for preparation of structures with required shapes and dimensions at the micrometer and nanometer scale. The first part of the thesis deals with one lithographic method – focused electron or ion beam induced deposition, for which a suitable adjustment of exposition parameters is searched and quality of deposited metal structures in terms of shape and elemental composition studied. Subsequently, attention is paid also to other types of lithographic methods (electron or ion beam lithography), which are applied in preparation of etching masks for the subsequent selective wet etching of silicon single crystals. In addition to optimization of mentioned techniques, the application of etched silicon surfaces for, e.g., selective growth of metal structures has been studied. The last part of the thesis is focused on functional properties of selected 2D or 3D structures.
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